VIAVI ONT-603D Optical Network Tester

Selling VIAVI ONT-600, ONT-603D OPTICAL NETWORK TESTER, CFP2 100G Ethernet 111.8G.  Used. Tested in good working and cosmetic condition , ONT-603D was used once as a demonstration. Comes with a30-day money back guarantee.

CFP2 data module with basic electrical adapter
3076/01: ONT-603D
3076/92.82: CFP2 100G/111G Data Single Port
3076/94.30: CFP2 Hardware Validation
3076/94.35: SR4 FEC Validation
3061/94.55: 100G/40G OTU4 with Client
3076/92.53: CFP2 4x25G Basic Electrical Adapter

Installed options
3061/94.50 : 100G Ethernet
3061/94.53 : ONT 111.8G with 100GE Client
3061/94.55 : ONT 111.8G Bulk
3076/94.30 : CFP2 Hardware Validation
3076/94.35 : SR4 FEC Aalidation

The modular design of the ONT-600 platform offers high flexibility and lets users operate multiple test modules simultaneously. The ONT-600 comes in a variety of mainframes and application modules, ranging from “single-port” point tools up to a full 19” rack-mounted multi-slot, multi-port and multiuser solution that satisfies sophisticated SVT needs.

Support for next generation, single lambda 100GE pluggables with KP4 FEC and 100GAUI-4

100G-DR (500 m on a single mode fiber) and 100G-FR/LR (up to 2/10 km on SMF) are part of the IEEE standard 802.3cd for 100GE serial transmission. A 100G-DR transponder carries the 100GE signal on a single lambda, using a rate of 53.125 GBaud with PAM-4 modulation and KP4 FEC - RS(544, 514). The solution described here also applies to 100G-FR/LR transponders (up to 2/10 km on SMF) that use 100GAUI-4 at the electrical side.
100G-DR signals are also used by 400G-DR4 transponders with 4 x 100G-DR breakout. 100G-DR transponders with the QSFP28 form factor can plug into standard, non-FEC (4 x 25.78 Gbit/s NRZ) QSFP28 cages, since they have their FEC on-board.
Typically, these transponders also have FEC bypass capability that can be activated via the I2C control interface. In this mode, the FEC needs to be done on the host board itself.
The ONT N-PORT module supports this mode, such that the electrical input into the DR transponder is a 4 x 26.5625 Gbit/s signal with KP4 FEC. This means that the ONT has full control of all FEC Error insertion parameters, and allows to thoroughly test FEC based chips, transponders and systems that are connected to the (up to 4) 100G-DR transponders plugged into the VIAVI N-PORT module.

Key Features

• Supports testing of all major Optical Transport technologies and services in the range from 155 Mbps up to 400 Gbps and beyond. Comprehensive range of supported physical interfaces.
• Test Applications for R&D, System Verification Test and Manufacturing include advanced error analysis, delay and service disruption tests, full overhead analysis, and skew tests for multilane signals
• Multiple mainframe options including rack-mount solutions and benchtop instruments with built-in display
• OTN: up to OTU4 / OTUC4 with ODU Muxing down to ODU0; ODUflex via OTUk, FlexO and OTLCn; ODU Multichannel
• Ethernet: Gigabit Ethernet up to 400 GE and FlexE fully supported with full stress/margin analysis
• SDH/SONET: 155 Mbps up to 40 Gbps, both native and mapped into OTN containers.
• Fibre Channel: 1/2/4/8/10/16/32G Fibre Channel
• CPRI: unframed and framed testing, CPRI line bit rate option 1 (614.40 Mbps) up to option 9 (12.165 Gbps); eCPRI
• Most accurate latency and service disruptions measurements for OTN, Ethernet, CPRI, Fibre Channel, and SONET/SDH
• Browser-oriented graphical user interface (GUI)
• Full multitasking and multi-user operation
• Full automation support via CLI or with drivers and libraries for LabWindows CVI, LabView, Python and Tcl/Tk

All application modules share the same GUI and identical automation and scripting, so that they can be used throughout the product development cycles.

Benefits

• 4 x QSFP28 ports for independent 100GAUI-4 test
• RX FEC Error Statistics with Symbol Errors per Codeword allows link margin investigations and PAM-4 photonics characterization
• TX FEC Error Generation in Single, Rate and Burst modes
• Critical in-depth testing of IC FEC Logic and design with user defined FEC modes, FEC Stress, and FEC Power Integrity Stress Tests (needs “Ethernet FEC Validation”, Option 401-820.60)

Applications

• 100G-DR IC and optical module validation and test
• 400G-DR4 breakout into 4 x 100G DR performance testing
• PAM-4 photonics performance investigations

Mainframe Specifications